Survata at Advertising Week NY 2018

After our appearance last year, Survata returns to Adverting Week New York 2018. Our VP of Measurement, Jon Stewart, will be joining ARF’s Scott McDonald session on “Two Aspects of Data Integrity: Accuracy and Ethics”. The session will take place on Tuesday, October 2nd at 2:30 PM and will cover:

-Results of proof-of-concept testing on third-party data validation method.
-Release of the ARF Code of Research Ethics that has been in progress since March 2018.
-GDPR at five months in: what course the legislation has set advertising on and what are the implications of this direction.

Featured Speakers:

Pete Doe – Chief Research Officer, Clypd
Abby Mehta, Ph.D. – SVP, Marketing Insights & Media Analytics, Bank of America
Michael Schoen – VP, Marketing Services, Neustar
Jon Stewart – VP of Measurement, Survata
Scott McDonald, Ph.D. – President & CEO, ARF (moderator)

To learn more about this session, please visit the Advertising Week program.